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Программная опция Rohde & Schwarz RTH-B1
Программная опция Rohde & Schwarz RTH-B1

Программная опция Rohde & Schwarz RTH-B1

RTH-B1


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Программная опция Rohde & Schwarz RTH-B1

Номер в Госреестре Наименование СИ Обозначение типа СИ Изготовитель Срок свидетельства или заводской номер
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Vertical system

 

Input channels   8 logic channels (from D0 to D7)
Input impedance   100 kΩ ± 2 % || ~4 pF (meas.) at probe tips
Maximum input frequency signal with minimum input voltage swing and hysteresis setting: normal 250 MHz (meas.)
Maximum input voltage   ±40 V (peak)
Minimum input voltage swing   500 mV (peak-to-peak) (meas.)
Threshold groups   from D0 to D3, D4 to D7
Threshold level range ±8 V in 25 mV steps
predefined CMOS 5.0 V, CMOS 3.3 V, CMOS 2.5 V, TTL, ECL, PECL, LVPECL
Threshold accuracy   ±(100 mV + 3 % of threshold setting)
Comparator hysteresis   normal, robust, maximum

 

Horizontal system

 

Channel deskew range for each channel ±100 ns
Channel-to-channel skew   < 2 ns (meas.)

 

Acquisition system

 

Maximum realtime sampling rate 1.25 Gsample/s on each channel
Maximum acquisition length for fast time bases (less than or equal to 20 ms/div) 125 ksample for each channel
Maximum acquisition length for slow time bases (greater than or equal to 50 ms/div) 125 ksample for each channel (sampleacquisition mode of analog channels even if no analog channel is active)
62.5 ksample for each channel (high resolution, peak detect, envelope and average acquisition modes of analog channels even if no analog channel isactive)

 

Trigger system

 

Trigger level range ±4 div from center of screen
Trigger modes   auto, normal, single
Trigger sources R&S®RTH1004 logic channels from D0 to D7CH1, CH2, CH3, CH4
R&S®RTH1002 logic channels from D0 to D7CH1, CH2
Hold off range time 8 ns to 10 s, fixed and random
events 1 to 1 000 000 000 events

 

 

Trigger types
Edge triggers on specified slope (positive, negative or either) and level
Glitch triggers on glitches of positive, negative or either polaritiy that are shorter or longer than specified width
glitch width 800 ps to 5000 s (CH1, CH2, CH3, CH4)
800 ps to 5000 s (D0 to D7)
Width triggers on positive or negative pulse of specified width; width can be shorter, longer,inside or outside the interval
pulse width 800 ps to 5000 s (CH1, CH2, CH3, CH4)
800 ps to 5000 s (D0 to D7)
Pattern triggers when a logical combination (and, nand, or, nor) of the input channels stays true for a period of time shorter, longer, inside or outside a specified range(requires R&S®RTH-K19 option)
pattern time 800 ps to 5000 s (CH1, CH2, CH3, CH4)
800 ps to 5000 s (D0 to D7)
State triggers when a logical combination (and, nand, or, nor) of the input channels stays true at a slope (positive, negative or either) in one selected channel; state values may be high (H), low (L) or don’t care (X) (requires R&S®RTH-K19 option)
Data2clock triggers on setup time and hold time violations between clock and data present on any two input channels; monitored time interval may be specified by the user with a step size of 800 ps in the range from –124 ns to 124 ns around a clock edge(requires R&S®RTH-K19 option)
Serial pattern triggers on serial data pattern up to 32 bit clocked by one input channel; pattern bitsmay be high (H), low (L) or don’t care (X); clock edge slope may be positive, negative or either (requires R&S®RTH-K19 option)
max. data rate < 250 Mbps
Timeout triggers when signal stays high, low or unchanged for a specified period of time (requires R&S®RTH-K19 option)
timeout 800 ps to 5000 s (CH1, CH2, CH3, CH4)
800 ps to 5000 s (D0 to D7)
Interval triggers when time between two consecutive edges of same slope (positive or negative) is shorter, longer inside or outside a specified range(requires R&S®RTH-K19 option)
interval time 800 ps to 5000 s (CH1, CH2, CH3, CH4)
800 ps to 5000 s (D0 to D7)
Protocol see R&S®RTH-K1, R&S®RTH-K2, R&S®RTH-K3, R&S®RTH-K9 and R&S®RTH-K10options

 

Waveform measurements

 

Automatic measurements on total number of active measurements 4
sources logic channels from D0 to D7
time based measurements period, frequency, positive pulse width, negative pulse width, positive duty cycle,negative duty cycle, delay, phase
amplitude based measurements mean value
count based measurements count positive pulses, count negativepulses, count rising edges, count falling edges
Cursor measurements sources logic channels from D0 to D7
vertical 2 cursors showing time, time difference and inverse time difference (frequency)
tracking vertical cursor additionally showing logic level and logic level difference of selected channel
measure defines gate for automatic measurements

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Волгоградский проспект, 42 к24